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IEICE Trans

Keyword : test response

Huffman-Based Test Response Coding
Hideyuki ICHIHARA Michihiro SHINTANI Tomoo INOUE 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2005/01/01
Vol. E88-D  No. 1 ; pp. 158-161
Type of Manuscript:  LETTER
Category: Dependable Computing
Keyword: 
Huffman code, test compression, test response, test application time, ATE, 
 Summary | Full Text:PDF