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IEICE Trans

Keyword : test program template

Design for Testability Method to Avoid Error Masking of Software-Based Self-Test for Processors
Masato NAKAZATO Michiko INOUE Satoshi OHTAKE Hideo FUJIWARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Vol. E91-D  No. 3 ; pp. 763-770
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSIs)
Category: High-Level Testing
Keyword: 
software-based self-test, processor, test program template, design for testability, error masking, at-speed testing, 
 Summary | Full Text:PDF