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IEICE Trans

Keyword : test generation schedule

On the Effect of Scheduling in Test Generation
Tomoo INOUE Hironori MAEDA Hideo FUJIWARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1996/08/25
Vol. E79-D  No. 8 ; pp. 1190-1197
Type of Manuscript:  PAPER
Category: Fault Tolerant Computing
Keyword: 
test generation, test generation schedule, fault ordering, fault dominance, cost of testing, 
 Summary | Full Text:PDF