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IEICE Trans

Keyword : test feature classifier

Distance-Based Test Feature Classifiers and Its Applications
Vakhtang LASHKIA Shun'ichi KANEKO Stanislav ALESHIN 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2000/04/25
Vol. E83-D  No. 4 ; pp. 904-913
Type of Manuscript:  PAPER
Category: Image Processing, Image Pattern Recognition
Keyword: 
learning, textual region location, Fourier feature, test feature classifier, 
 Summary | Full Text:PDF