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IEICE Trans

Keyword : test data volume

Scan Shift Time Reduction Using Test Compaction for On-Chip Delay Measurement
Wenpo ZHANG Kazuteru NAMBA Hideo ITO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2014/03/01
Vol. E97-D  No. 3 ; pp. 533-540
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
small-delay defects, test compaction, test application time, test data volume, on-chip delay measurement, 
 Summary | Full Text:PDF