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IEICE Trans

Keyword : test data reduction

Scan Chain Ordering to Reduce Test Data for BIST-Aided Scan Test Using Compatible Scan Flip-Flops
Hiroyuki YOTSUYANAGI Masayuki YAMAMOTO Masaki HASHIZUME 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2010/01/01
Vol. E93-D  No. 1 ; pp. 10-16
Type of Manuscript:  Special Section PAPER (Special Section on Test, Diagnosis and Verification of SOCs)
Category: 
Keyword: 
BIST-aided scan test, scan chain ordering, test data reduction, compatible flip-flops, test pattern generation, 
 Summary | Full Text:PDF
Study on Test Data Reduction Combining Illinois Scan and Bit Flipping
Masayuki ARAI Satoshi FUKUMOTO Kazuhiko IWASAKI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Vol. E91-D  No. 3 ; pp. 720-725
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSIs)
Category: Test Compression
Keyword: 
test data reduction, Illinois scan, bit flipping, BIST-aided scan test, 
 Summary | Full Text:PDF