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IEICE Trans

Keyword : switching current

Test Sequence Generation for Test Time Reduction of IDDQ Testing
Hiroyuki YOTSUYANAGI Masaki HASHIZUME Takeomi TAMESADA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/03/01
Vol. E87-D  No. 3 ; pp. 537-543
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSI)
Category: Test Generation and Compaction
Keyword: 
IDDQ testing, bridging faults, switching current, supply current test, CMOS circuits, 
 Summary | Full Text:PDF