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IEICE Trans

Keyword : specified cell (SC)

Generalized Marching Test for Detecting Pattern Sensitive Faults in RAMs
Masahiro HASHIMOTO Eiji FUJIWARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1993/07/25
Vol. E76-D  No. 7 ; pp. 809-816
Type of Manuscript:  Special Section PAPER (Special Issue on VLSI Testing and Testable Design)
Category: 
Keyword: 
marching test, cell-distance, specified cell (SC), background cell (BC), static pattern sensitive faults (SPSF), dynamic pattern sensitive faults (DPSF), generalized marching test, 
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