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IEICE Trans

Keyword : small delay faults

Improving Test Coverage by Measuring Path Delay Time Including Transmission Time of FF
Wenpo ZHANG Kazuteru NAMBA Hideo ITO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2013/05/01
Vol. E96-D  No. 5 ; pp. 1219-1222
Type of Manuscript:  LETTER
Category: Dependable Computing
Keyword: 
small delay faults, test coverage, flip-flop, clock pulse, 
 Summary | Full Text:PDF