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IEICE Trans

Keyword : scan cell reordering

A Selective Scan Chain Activation Technique for Minimizing Average and Peak Power Consumption
Yongjoon KIM Jaeseok PARK Sungho KANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2010/01/01
Vol. E93-D  No. 1 ; pp. 193-196
Type of Manuscript:  LETTER
Category: Dependable Computing
Keyword: 
design for testability (DfT), scan testing, scan cell reordering, low power test, 
 Summary | Full Text:PDF