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IEICE Trans

Keyword : pseudoexhaustive testing

Minimum Test Set for Locally Exhaustive Testing of Multiple Output Combinational Circuits
Hiroyuki MICHINISHI Tokumi YOKOHIRA Takuji OKAMOTO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1993/07/25
Vol. E76-D  No. 7 ; pp. 791-799
Type of Manuscript:  Special Section PAPER (Special Issue on VLSI Testing and Testable Design)
Category: 
Keyword: 
built-in-self-test, pseudoexhaustive testing, verification testing, locally exhaustive testing, test pattern generation, 
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