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IEICE Trans

Keyword : processor test

Delay Fault Testing of Processor Cores in Functional Mode
Virendra SINGH Michiko INOUE Kewal K. SALUJA Hideo FUJIWARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2005/03/01
Vol. E88-D  No. 3 ; pp. 610-618
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
processor test, delay fault testing, software-based self-test, at-speed test, 
 Summary | Full Text:PDF