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IEICE Trans

Keyword : process shift

On-Chip Detection of Process Shift and Process Spread for Post-Silicon Diagnosis and Model-Hardware Correlation
A.K.M. Mahfuzul ISLAM Hidetoshi ONODERA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2013/09/01
Vol. E96-D  No. 9 ; pp. 1971-1979
Type of Manuscript:  Special Section PAPER (Special Section on Dependable Computing)
Category: 
Keyword: 
process shift, process spread, monitor structure, post-silicon analysis, delay test, adaptive test, 
 Summary | Full Text:PDF