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IEICE Trans

Keyword : path delay faults N-propagation test-pair set

An Alternative Test Generation for Path Delay Faults by Using Ni-Detection Test Sets
Hiroshi TAKAHASHI Kewal K. SALUJA Yuzo TAKAMATSU 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2003/12/01
Vol. E86-D  No. 12 ; pp. 2650-2658
Type of Manuscript:  Special Section PAPER (Special Issue on Dependable Computing)
Category: Test
Keyword: 
test generation, path delay faults N-propagation test-pair set, combinational circuits, 
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