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IEICE Trans

Keyword : partial circuit duplication

Improving Random Pattern Testability with Partial Circuit Duplication Approach
Hiroshi YOKOYAMA Xiaoqing WEN Hideo TAMAMOTO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1998/07/25
Vol. E81-D  No. 7 ; pp. 654-659
Type of Manuscript:  Special Section PAPER (Special Issue on Test and Diagnosis of VLSI)
Category: Design for Testability
Keyword: 
partial circuit duplication, random testing, design for testability, built-in self-test, 
 Summary | Full Text:PDF