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IEICE Trans

Keyword : parametric faults

Analog Circuit Test Using Transfer Function Coefficient Estimates
Zhen GUO Jacob SAVIR 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/03/01
Vol. E87-D  No. 3 ; pp. 642-646
Type of Manuscript:  Special Section LETTER (Special Section on Test and Verification of VLSI)
Category: 
Keyword: 
fault detection, parametric faults, Monte-Carlo simulation, system identification, 
 Summary | Full Text:PDF