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IEICE Trans

Keyword : multi-model fault coverage

Defect Level Prediction Using Multi-Model Fault Coverage
Shyue-Kung LU 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/06/01
Vol. E87-D  No. 6 ; pp. 1488-1495
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
defect level, fault coverage, multi-model fault coverage, yield, 
 Summary | Full Text:PDF