Publication: IEICE TRANSACTIONS on Information and Systems
Publication Date: 2002/03/01
Vol. E85-D
No. 3 ;
pp. 444-454
Type of Manuscript:
INVITED PAPER (Special Issue on the 2000 IEICE Excellent Paper Award)
Category: Artificial Intelligence,Cognitive Science Keyword: model-based diagnosis, fault model, probabilistic temporal logic, Akaike information criterion, |