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Diagnosing Binary Content Addressable Memories with Comparison and RAM Faults
Jin-Fu LI | Publication: IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/03/01
Vol. E87-D
No. 3 ;
pp. 601-608
Type of Manuscript:
Special Section PAPER (Special Section on Test and Verification of VLSI)
Category: Memory Testing
Keyword:
content addressable memories, testing, diagnosis, march test, | | | Summary | Full Text:PDF | |
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