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IEICE Trans

Keyword : low power pattern generator

A New Scan Power Reduction Scheme Using Transition Freezing for Pseudo-Random Logic BIST
Youbean KIM Kicheol KIM Incheol KIM Hyunwook SON Sungho KANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/04/01
Vol. E91-D  No. 4 ; pp. 1185-1188
Type of Manuscript:  LETTER
Category: Computer Components
Keyword: 
low power BIST (Built-in Self Test), pseudo-random BIST, low power pattern generator, 
 Summary | Full Text:PDF