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IEICE Trans

Keyword : linear sequential circuit

Two-Pattern Test Capabilities of Autonomous TGP Circuits
Kiyoshi FURUYA Edward J. McCLUSKEY 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1993/07/25
Vol. E76-D  No. 7 ; pp. 800-808
Type of Manuscript:  Special Section PAPER (Special Issue on VLSI Testing and Testable Design)
Category: 
Keyword: 
two-pattern testing, built-in self-test, TPG circuit, linear sequential circuit, transition coverage, 
 Summary | Full Text:PDF