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IEICE Trans

Keyword : fault-detection

Potential of Fault-Detection Coverage by means of On-Chip Redundancy - IEC61508: Are There Royal Roads to SIL 4?
Nobuyasu KANEKAWA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2013/09/01
Vol. E96-D  No. 9 ; pp. 1907-1913
Type of Manuscript:  Special Section PAPER (Special Section on Dependable Computing)
Category: 
Keyword: 
on-chip redundancy, fault-detection, common cause failure, functional safety, IEC61508, 
 Summary | Full Text:PDF