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IEICE Trans

Keyword : error identification

Error Identification in At-Speed Scan BIST Environment in the Presence of Circuit and Tester Speed Mismatch
Yoshiyuki NAKAMURA Thomas CLOUQUEUR Kewal K. SALUJA Hideo FUJIWARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2006/03/01
Vol. E89-D  No. 3 ; pp. 1165-1172
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
BIST, fault diagnosis, error identification, at-speed test, low speed tester, 
 Summary | Full Text:PDF