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IEICE Trans

Keyword : embedded software development

An Effective Testing Method for Hardware Related Fault in Embedded Software
Takeshi SUMI Osamu MIZUNO Tohru KIKUNO Masayuki HIRAYAMA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2005/06/01
Vol. E88-D  No. 6 ; pp. 1142-1149
Type of Manuscript:  Special Section PAPER (Special Section on Software Engineering for Embedded Systems)
Category: 
Keyword: 
embedded software development, fault tree analysis, software testing, 
 Summary | Full Text:PDF