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IEICE Trans

Keyword : easily testable sequential circuits

Classification of Sequential Circuits Based on τk Notation and Its Applications
Chia Yee OOI Thomas CLOUQUEUR Hideo FUJIWARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2005/12/01
Vol. E88-D  No. 12 ; pp. 2738-2747
Type of Manuscript:  PAPER
Category: VLSI Systems
Keyword: 
test generation, easily testable sequential circuits, complexity, design for testability, synthesis for testability, 
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