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IEICE Trans

Keyword : double node upset (DNU)

Complete Double Node Upset Tolerant Latch Using C-Element
Yuta YAMAMOTO Kazuteru NAMBA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2020/10/01
Vol. E103-D  No. 10 ; pp. 2125-2132
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
single event upset (SEU), double node upset (DNU), soft error, C-element, 
 Summary | Full Text:PDF