A Clustered RIN BIST Based on Signal Probabilities of Deterministic Test Sets Dong-Sup SONGSungho KANG
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2006/01/01 Vol. E89-DNo. 1 ;
pp. 354-357 Type of Manuscript: LETTER Category: Dependable Computing Keyword: deterministic logic BIST, embedded core testing,