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IEICE Trans

Keyword : design for testing

Fast Testable Design for SRAM-Based FPGAs
Abderrahim DOUMAR Toshiaki OHMAMEUDA Hideo ITO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2000/05/25
Vol. E83-D  No. 5 ; pp. 1116-1127
Type of Manuscript:  PAPER
Category: Fault Tolerance
Keyword: 
field programmable gate array (FPGA), testing, design for testing, shifting configurations, 
 Summary | Full Text:PDF