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IEICE Trans

Keyword : deduction algorithm

A Method of Multiple Fault Diagnosis in Sequential Circuits by Sensitizing Sequence Pairs
Nobuhiro YANAGIDA Hiroshi TAKAHASHI Yuzo TAKAMATSU 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1997/01/25
Vol. E80-D  No. 1 ; pp. 28-37
Type of Manuscript:  Special Section PAPER (Special Issue on Fault-Tolerant Computing)
Category: Testing/Checking
Keyword: 
sequential circuits, circuit level diagnosis, sensitizing sequence pairs, deduction algorithm, suspected/candidate faults, 
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