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IEICE Trans

Keyword : confidence level

Multiscale Bagging and Its Applications
Hidetoshi SHIMODAIRA Takafumi KANAMORI Masayoshi AOKI Kouta MINE 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2011/10/01
Vol. E94-D  No. 10 ; pp. 1924-1932
Type of Manuscript:  Special Section PAPER (Special Section on Information-Based Induction Sciences and Machine Learning)
Category: 
Keyword: 
bagging, active learning, confidence level, classification, 
 Summary | Full Text:PDF
RAM BIST
Jacob SAVIR 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2001/01/01
Vol. E84-C  No. 1 ; pp. 102-107
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
memory test, stuck-at fault, coupled-cell faults, pattern-sensitive faults, test length, confidence level, Markov chain, 
 Summary | Full Text:PDF