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IEICE Trans

Keyword : concurrent testing

Concurrent Core Testing for SOC Using Merged Test Set and Scan Tree
Gang ZENG Hideo ITO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2006/03/01
Vol. E89-D  No. 3 ; pp. 1157-1164
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
concurrent testing, SOC testing, test cost reduction, test data compression, 
 Summary | Full Text:PDF