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IEICE Trans

Keyword : comments

Lines of Comments as a Noteworthy Metric for Analyzing Fault-Proneness in Methods
Hirohisa AMAN Sousuke AMASAKI Takashi SASAKI Minoru KAWAHARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2015/12/01
Vol. E98-D  No. 12 ; pp. 2218-2228
Type of Manuscript:  PAPER
Category: Software Engineering
Keyword: 
product metrics, fault-prone method prediction, comments, regression model, 
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