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IEICE Trans

Keyword : capture safe test vectors

A Low Capture Power Test Generation Method Based on Capture Safe Test Vector Manipulation
Toshinori HOSOKAWA Atsushi HIRAI Yukari YAMAUCHI Masayuki ARAI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2017/09/01
Vol. E100-D  No. 9 ; pp. 2118-2125
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
low power, test generation, capture safe test vectors, test vector synthesis, unsafe faults, 
 Summary | Full Text:PDF