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IEICE Trans

Keyword : built-in self-testing

Cellular Automata Implementation of TPG Circuits for Built-In Two-Pattern Testing
Kiyoshi FURUYA Naoki NAKAMURA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1998/07/25
Vol. E81-D  No. 7 ; pp. 675-681
Type of Manuscript:  Special Section PAPER (Special Issue on Test and Diagnosis of VLSI)
Category: Built-in Self-Test
Keyword: 
cellular automata, built-in self-testing, TPG circuit, random pattern generation, 
 Summary | Full Text:PDF