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IEICE Trans

Keyword : broadside scan test

Formal Verification-Based Redundancy Identification of Transition Faults with Broadside Scan Tests
Hiroshi IWATA Nanami KATAYAMA Ken'ichi YAMAGUCHI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2017/06/01
Vol. E100-D  No. 6 ; pp. 1182-1189
Type of Manuscript:  Special Section PAPER (Special Section on Formal Approach)
Category: Formal techniques
Keyword: 
redundancy identification, transition faults, broadside scan test, formal verification and functional equivalence, 
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