|
| Keyword : bijection
|
Delay Fault Testing for CMOS Iterative Logic Arrays with a Constant Number of Patterns
Shyue-Kung LU | Publication: IEICE TRANSACTIONS on Information and Systems
Publication Date: 2003/12/01
Vol. E86-D
No. 12 ;
pp. 2659-2665
Type of Manuscript:
Special Section PAPER (Special Issue on Dependable Computing)
Category: Test
Keyword:
delay fault, Iterative Logic Array, C-testable, bijection, | | | Summary | Full Text:PDF | |
|
|