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IEICE Trans

Keyword : basic pattern

Contour-Based Window Extraction Algorithm for Bare Printed Circuit Board Inspection
Shih-Yuan HUANG Chi-Wu MAO Kuo-Sheng CHENG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2005/12/01
Vol. E88-D  No. 12 ; pp. 2802-2810
Type of Manuscript:  PAPER
Category: Pattern Recognition
Keyword: 
printed circuit board, window-based technique, basic pattern, 
 Summary | Full Text:PDF