Amodal Instance Segmentation of Thin Objects with Large Overlaps by Seed-to-Mask Extending Ryohei KANKEMasanobu TAKAHASHI
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2024/07/01 Vol. E107-DNo. 7 ;
pp. 908-911 Type of Manuscript: LETTER Category: Image Recognition, Computer Vision Keyword: amodal instance segmentation, deep learning, thin object, seed,