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IEICE Trans

Keyword : X-bit distribution

A Test Compaction Oriented Don't Care Identification Method Based on X-bit Distribution
Hiroshi YAMAZAKI Motohiro WAKAZONO Toshinori HOSOKAWA Masayoshi YOSHIMURA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2013/09/01
Vol. E96-D  No. 9 ; pp. 1994-2002
Type of Manuscript:  Special Section PAPER (Special Section on Dependable Computing)
Category: 
Keyword: 
X-bit, don't care identification, X-bit distribution, test compaction, 
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