Publication: IEICE TRANSACTIONS on Information and Systems
Publication Date: 1995/07/25
Vol. E78-D
No. 7 ;
pp. 839-844
Type of Manuscript:
Special Section PAPER (Special Issue on Verification, Test and Diagnosis of VLSI Systems)
Category:
Keyword:
IDDq test, CMOS VLSI, fault coverage, defect level, toggle rate, stuck-at fault, design for testability, |