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IEICE Trans

Keyword : Hilbert scan

A Two-Stage Point Pattern Matching Algorithm Using Ellipse Fitting and Dual Hilbert Scans
Li TIAN Sei-ichiro KAMATA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/10/01
Vol. E91-D  No. 10 ; pp. 2477-2484
Type of Manuscript:  PAPER
Category: Pattern Recognition
Keyword: 
point pattern matching, ellipse fitting, Hilbert scan, transformation parameter estimation, search space reduction, 
 Summary | Full Text:PDF
An N-Dimensional Pseudo-Hilbert Scan for Arbitrarily-Sized Hypercuboids
Jian ZHANG Sei-ichiro KAMATA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2008/03/01
Vol. E91-A  No. 3 ; pp. 846-858
Type of Manuscript:  PAPER
Category: Image
Keyword: 
space-filling curve, Hilbert scan, Euclidean distance, look-up table, hypercube, 
 Summary | Full Text:PDF