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IEICE Trans

Keyword : C-testable design

Design of C-Testable Modified-Booth Multipliers
Kwame Osei BOATENG Hiroshi TAKAHASHI Yuzo TAKAMATSU 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2000/10/25
Vol. E83-D  No. 10 ; pp. 1868-1878
Type of Manuscript:  PAPER
Category: Fault Tolerance
Keyword: 
multiplier, modified Booth Algorithm, design for testability (DFT), C-testable design, 
 Summary | Full Text:PDF