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IEICE Trans

Keyword : void evolution

An Adaptive Grid Approach for the Simulation of Electromigration Induced Void Migration
Hajdin CERIC Siegfried SELBERHERR 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2003/03/01
Vol. E86-C  No. 3 ; pp. 421-426
Type of Manuscript:  INVITED PAPER (Special Issue on the 2002 IEEE International Conference on Simulation of Semiconductor Processes and Devices (SISPAD'02))
Category: 
Keyword: 
electromigration, diffuse interface model, grid adaptation, void evolution, finite element method, 
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