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IEICE Trans

Keyword : transmission line pulse (TLP)

An Unassisted Low-Voltage-Trigger ESD Protection Structure in a 0.18-µm CMOS Process without Extra Process Cost
Bing LI Yi SHAN 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/08/01
Vol. E93-C  No. 8 ; pp. 1359-1364
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
electrostatic discharge (ESD), unassisted, low-voltage-trigger, transmission line pulse (TLP), trigger voltage, second breakdown current, mask, 
 Summary | Full Text:PDF