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IEICE Trans

Keyword : transient zone problem

A New Analog-to-Digital Converter BIST Considering a Transient Zone
Incheol KIM Kicheol KIM Youbean KIM HyeonUk SON Sungho KANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2007/11/01
Vol. E90-C  No. 11 ; pp. 2161-2163
Type of Manuscript:  LETTER
Category: Integrated Electronics
Keyword: 
static ADC built-in self-test, transient zone problem, 
 Summary | Full Text:PDF