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IEICE Trans

Keyword : time domain gating process

Electromagnetic Scattering Analysis for Crack Depth Estimation
Hidenori SEKIGUCHI Hiroshi SHIRAI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2003/11/01
Vol. E86-C  No. 11 ; pp. 2224-2229
Type of Manuscript:  Special Section PAPER (Special Issue on Analytical and Simulation Methods for Electromagnetic Wave Problems)
Category: 
Keyword: 
crack depth estimation, radar cross section, RCS, time domain gating process, dip frequency, 
 Summary | Full Text:PDF