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IEICE Trans

Keyword : threshold operation device

LSI Implementation and Safety Verification of Window Comparator Used in Fail-Safe Multiple-Valued Logic Operations
Masakazu KATO Masayoshi SAKAI Koji JINKAWA Koichi FUTSUHARA Masao MUKAIDONO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1993/03/25
Vol. E76-C  No. 3 ; pp. 419-427
Type of Manuscript:  Special Section PAPER (Special Issue on Multiple-Valued Integrated Circuits)
Category: 
Keyword: 
fault tolerance, multiple-valued logic, fail-safe, threshold operation, threshold operation device, 
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