Test Structures and a Modified Transmission Line Pulse System for the Study of Electrostatic Discharge Robert A. ASHTON
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1996/02/25 Vol. E79-CNo. 2 ;
pp. 158-164 Type of Manuscript: Special Section PAPER (Special Issue on Microelectronic Test Structures) Category: Device and Circuit Characterization Keyword: integrated electronics, semiconductor materials and devices, ESD, test structures, reliability,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1996/02/25 Vol. E79-CNo. 2 ;
pp. 219-225 Type of Manuscript: Special Section PAPER (Special Issue on Microelectronic Test Structures) Category: Statistical Analysis Keyword: DOE, RSM, wafer mapping, test structures, integrated circuits,