Different Mechanisms of Temperature Dependency of N-Hit SET in Bulk and PD-SOI Technology Biwei LIUYankang DUKai ZHANG
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2014/05/01 Vol. E97-CNo. 5 ;
pp. 455-459 Type of Manuscript: PAPER Category: Semiconductor Materials and Devices Keyword: N-hit SET, temperature dependency, carrier mobility, carrier lifetime,