|
| Keyword : stress probability
|
Stress Probability Computation for Estimating NBTI-Induced Delay Degradation
Hiroaki KONOURA Yukio MITSUYAMA Masanori HASHIMOTO Takao ONOYE | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2011/12/01
Vol. E94-A
No. 12 ;
pp. 2545-2553
Type of Manuscript:
Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Device and Circuit Modeling and Analysis
Keyword:
NBTI, stress probability, timing analysis, | | | Summary | Full Text:PDF | |
| |
|
|